Scidà, Alessandra (2011) Spectroscopic analyses of molecular packing in pentacene thin films. Il nuovo cimento C, 34 (5). pp. 103-107. ISSN 1826-9885
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Abstract
Pentacene thin films are studied with three different and not invasive techniques to assess their capability to identify the thin-film thickness (in this research from 50nm to 300 nm). Atomic Force Microscopy can detect the morphology of a surface and therefore the thickness at the edge of a scratch in the layer. X-ray spectroscopy can assess the presence of a bulk-phase and a thin-film phase related to the thickness of a pentacene layer. Finally the photocurrent spectroscopy, carried out on pentacene thin-film transistors, can measure the density of states distribution around the band edge and show the increase of the Davydov splitting related to a particular thickness. This information is extremely useful in the implementation of electronic devices like Organic Thin Film Transistors (OTFT), Organic LEDs and solar cells.
| Item Type: | Article |
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| Uncontrolled Keywords: | Organic semiconductors ; Photoconduction and photovoltaic effects ; Field effect devices |
| Subjects: | 500 Scienze naturali e Matematica > 530 Fisica |
| Depositing User: | Marina Spanti |
| Date Deposited: | 08 Apr 2020 16:38 |
| Last Modified: | 08 Apr 2020 16:38 |
| URI: | http://eprints.bice.rm.cnr.it/id/eprint/17459 |
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