Brocchieri, J. and Scialla, E. and Ambrosino, F. and Terrasi, F. and Sabbarese, C. (2018) Ag X-ray fluorescence on different thickness and concentration layers. Il nuovo cimento C, 41 (6). pp. 1-8. ISSN 1826-9885
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Abstract
This work derives from the requirement to investigate on the silver surface enrichment of objects of historical and artistic interest using the X-ray fluorescence non-destructive technique (XRF). The aim is the thickness estimation through the experimental relationship between Kα Kβ and Kα Lα of Ag as a function of the thickness. Measurements on silver sheets of different thicknesses and three concentrations are carried out using a XRF spectrometer with a maximum voltage of 50kV. The results allow to analyse the plating layer of silver objects also to make other interesting considerations.
| Item Type: | Article |
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| Subjects: | 500 Scienze naturali e Matematica > 530 Fisica |
| Depositing User: | Marina Spanti |
| Date Deposited: | 27 Nov 2020 09:44 |
| Last Modified: | 27 Nov 2020 09:44 |
| URI: | http://eprints.bice.rm.cnr.it/id/eprint/20361 |
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