Bonfigli, F. and Capotondi, F. and Cricenti, A. and Giannessi, L. and Kiskinova, M. (2019) Imaging detectors based on photoluminescence of radiation-induced defects in lithium fluoride for XFEL beam monitoring. Il nuovo cimento C, 42 (5). pp. 1-8. ISSN 1826-9885
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Abstract
Lithium fluoride (LiF) films and crystals are versatile X-ray imaging detectors based on the optical reading of visible photoluminescence from radiationinduced electronic defects. Distinctive features of these detectors are their high spatial resolution across a large field of view, wide dynamic range and insensitivity to ambient light. These peculiarities of LiF detectors appear to be promising for monitoring the spatial intensity distribution of ultra-short, ultra-high pulses of the EUV-X-ray Free Electron Laser (XFEL) and could be exploited for coherent diffraction imaging experiments.
| Item Type: | Article |
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| Subjects: | 500 Scienze naturali e Matematica > 530 Fisica |
| Depositing User: | Marina Spanti |
| Date Deposited: | 29 Jan 2021 14:54 |
| Last Modified: | 29 Jan 2021 14:54 |
| URI: | http://eprints.bice.rm.cnr.it/id/eprint/20680 |
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