Massi, M. (2011) The ion microbeam facility of Florence: A versatile instrument for the analysis and modification of materials. Il nuovo cimento C, 34 (1). pp. 91-102. ISSN 1826-9885
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Abstract
A brief description of the relevant features of the external scanning ion microbeam facility installed at the 3MV tandem accelerator in Florence is here reported. With our facility we can work in “external” set-up (the target is kept in atmosphere) with a beam spot size on sample better than 10 μm. The Ion Beam Analyses (IBA) detection set-up of our microbeam allows us to exploit simultaneously PIXE (Particle-Induced X-ray Emission), PIGE (Particle-Induced γ-ray Emission), BS (Backscattering Spectrometry) and IBIL (Ion-Beam–Induced Luminescence) techniques; in combination with a scanning system, it is thus possible to fully characterize samples, through the collection of 2D maps of structural and elemental information. Finally, an activity recently started at the microbeam of Florence with regards to the ion modification of diamond is reported.
| Item Type: | Article |
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| Uncontrolled Keywords: | Interdisciplinary applications of physics ; Electron, positron, and ion microscopes;electron diffractometers ; Scanning probe microscopes and components ; Methods of materials testing and analysis |
| Subjects: | 500 Scienze naturali e Matematica > 530 Fisica |
| Depositing User: | Marina Spanti |
| Date Deposited: | 03 Apr 2020 15:14 |
| Last Modified: | 03 Apr 2020 15:14 |
| URI: | http://eprints.bice.rm.cnr.it/id/eprint/17185 |
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