Passeri, D. and Anastasiadis, P. and Tamburri, E. and Guglielmotti, V. and Rossi, M. (2013) Scanning probe microscopy techniques for mechanical characterization at nanoscale. Il nuovo cimento C, 36 (2). pp. 83-88. ISSN 1826-9885
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Abstract
Three atomic force microscopy (AFM)-based techniques are reviewed that allow one to conduct accurate measurements of mechanical properties of either stiff or compliant materials at a nanometer scale. Atomic force acoustic microscopy, AFM-based depth sensing indentation, and torsional harmonic AFM are briefly described. Examples and results of quantitative characterization of stiff (an ultrathin SeSn film), soft polymeric (polyaniline fibers doped with detonation nanodiamond) and biological (collagen fibers) materials are reported.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Atomic force microscopy (AFM) ; Elastic moduli ; Mechanical and acoustical properties ; Physical properties of polymers |
| Subjects: | 500 Scienze naturali e Matematica > 530 Fisica |
| Depositing User: | Marina Spanti |
| Date Deposited: | 05 May 2020 12:31 |
| Last Modified: | 05 May 2020 12:31 |
| URI: | http://eprints.bice.rm.cnr.it/id/eprint/18249 |
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