Cojoc, Danut Adrian Investigation into local cell mechanics by atomic force microscopy mapping and optical tweezer vertical indentation. Nanotecnology. (Submitted)
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Articolo_2016_Nanotech_Investigation into local cell mechanics by AFM OT_eprints.pdf - Accepted Version Download (1MB) | Preview |
Abstract
The investigation of mechanical properties of cells represents a potential source of label free markers of cancer progression, based on measurable viscoelastic parameters. The Young modulus proved to be the most studied so far, however, even for the same cell type, the elastic modulus reported in different studies spans over a wide range of values, mainly due to the application of different experimental conditions. This complicates a reliable use of elasticity for mechanical phenotyping of cells. Here we combine two complementary techniques, Atomic Force Microscopy (AFM) and Optical Tweezers Microscopy (OTM), providing a comprehensive mechanical comparison of three human breast cell lines: normal myoepithelial (HBL-100), luminal breast cancer (MCF-7) and basal breast cancer (MDA-MB-231) cells. The elastic modulus was locally measured by AFM and OTM on single cells, using similar indentation approaches but different measurement parameters. Peak force tapping AFM was employed at nN forces and high loading rate to draw a viscoelastic map of each cell and the results indicated the region on top of the nuclei as the most meaningful. OTM was employed at those locations at pN forces and low loading rates, to measure the elastic modulus in a real elastic regime and rule out the contribution of viscous forces typical of AFM. When measured by either AFM or OTM, the cell lines elasticity trend was similar for the aggressive MDA-MB-231 cells, which were found to be significantly softer than the other two cell types in both measurements. However, when comparing HBL100 and MCF-7 cells, we found significant differences only when using OTM
| Item Type: | Article |
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| Uncontrolled Keywords: | Cell Bio-mechanics, Breast Cancer, Atomic Force Microscopy, Optical Tweezers |
| Subjects: | 500 Scienze naturali e Matematica > 530 Fisica 500 Scienze naturali e Matematica > 530 Fisica > 539 Fisica moderna > 539.1 Struttura della materia 500 Scienze naturali e Matematica > 570 Scienze della vita; Biologia 600 Tecnologia - Scienze applicate > 620 Ingegneria e attivita' affini > 621 Fisica applicata; Ingegneria meccanica > 621.3 Ingegneria elettrotecnica; Illuminazione; Superconduttivita'; Ingegneria magnetica; Ottica applicata; Tecnologia parafotica; Elettronica; Ingegneria delle comunicazioni; Elaboratori > 621.36 Ingegneria ottica (classificare qui l'Ottica applicata; le opere sulla tecnologia dell'infrarosso e dell'ultravioletto insieme) |
| Depositing User: | Dr Danut Adrian Cojoc |
| Date Deposited: | 04 Jul 2023 14:56 |
| Last Modified: | 04 Jul 2023 14:56 |
| URI: | http://eprints.bice.rm.cnr.it/id/eprint/22396 |
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